Vitrek – V7X Series Hipot Testers

Accuracy specifications shown are valid at temperatures within ±5C of the calibration temperature. Outside of this range, add 10% of the specification per C.

Decrease maximum ACW, DCW, and IR voltages by 2.5%/1000ft above 5000ft ASL altitude.

All accuracy specifications are valid at the V7X terminals, and as such, do not include any effects due to user wiring resistances, leakages or coupling, or other user-generated leakages or interference.

Resolutions shown are for displayed measurements, limits, and settings. Internally all measurements typically have 10x better resolution, and all limits and settings are implemented with the same resolution as entered by the user. Via an interface, all measurements are reported with 5 digit resolution.

Generally, user settings can be defined with up to 4 digit resolution and a selection of units (e.g. µA or mA) from the front panel; or with up to 6 digit resolution from an interface.

Unless otherwise specified, user terminated dwell/test periods can extend for up to 2 days.

Not all test types are available in all models of V7X.

ACW Test Steps

Voltage

10 to 5000Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%

Model V75: 10 to 2000Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%

Model V76: 10 to 2500Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%

1%+5V accuracy under all allowed loading conditions

Max. Load

20mArms (10mArms max resistive for >10sec), reduced by 20µA per V below 1000V, reduced by 10µA per V above 4000V

Leakage Accuracy

DC coupled, true RMS, 10Hz-4KHz 3dB bandwidth

DUT isolated (<1.1mA) : 1%+5µA (1µA resolution) DUT isolated (>1.1mA) : 1%+30µA (10µA resolution)

DUT grounded : 1%+30µA+(4µA per KV) (10µA resolution)

ARC Limit

Disabled or up to 30mA (1mA resolution)

Ramp

0 to 99.9sec (0.02sec resolution)

Dwell

0.1 to 9999sec (0.1sec resolution) or user terminated

Shutdown

Excessive HV terminal current : within 1ms

User Stop : within 2ms

Interlock opened (if enabled) : within 2ms

Load Breakdown (a sudden uncontrolled increase of load current): within 150µs

Leakage Limit (if enabled): within 100ms

ARC Limit (if enabled): within 1ms

User Settings

Voltage Level

Frequency

DUT Isolated/Grounded

Min. Leakage Limit (can be disabled)

Max. Leakage Limit (can be disabled)

ARC Limit (can be disabled)

Ramp Period

Dwell Period

Ramp Down Fast/As Ramp

Stop/Continue Sequence on Failure

DCW Test Steps

Voltage

20 to 5000VDC (1V resolution)

Model V75: 20 to 3000VDC (1V resolution)

Model V76: 20 to 2750VDC (1V resolution)

1%+5V accuracy under all allowed loading conditions

Max. Load

<2000V : 10mA (reduce by 10uA per Volt below 1000V), <0.25uF capacitance

2000-3000V: 7mA (reduce by 4µA per volt above 2000V), <0.1µF capacitance

3000-4000V : 3mA (reduce by 1µA per volt above 3000V), <0.05µF capacitance >4000V : 2mA (reduce by 0.5µA per volt above 4000V), <0.03µF capacitance

Leakage Accuracy

DUT resistive, isolated (<200µA) : 1%+1µA (0.1µA resolution)

DUT resistive, isolated (0.2-1.5mA) : 1%+2µA (1µA resolution)

Otherwise : 1%+20µA (10µA resolution)

ARC Limit

Disabled or up to 30mA (1mA resolution)

Ramp

DUT resistive : 0.1 to 99.9sec (0.02sec resolution)

DUT capacitive : 1.0 to 99.9sec (0.02sec resolution)

Dwell

0.1 to 9999sec (0.02sec resolution) or user terminated

Ramp Down

0sec or as defined for ramp

Discharge Internal

50KΩ discharge load and 0.03µF capacitive energy

Shutdown

Excessive HV terminal current: within 1ms

User Stop: within 2ms

Interlock opened (if enabled) : within 2ms

Load Breakdown (sudden uncontrolled increase of load current): within 150µs

Leakage Limit (if enabled): within 100ms

ARC Limit (if enabled): within 1ms

User Settings

Voltage Level

DUT Isolated/Grounded

DUT Resistive/Capacitive

Min. Leakage Limit (can be disabled)

Max. Leakage Limit (can be disabled)

ARC Limit (can be disabled)

Ramp Period

Dwell Period

Ramp Down Fast/As Ramp

Stop/Continue Sequence on Failure

IR Test Steps

Voltage

20 to 5000VDC (1V resolution)

Model V75: 20 to 3000VDC (1V resolution)

Model V76: 20 to 2750VDC (1V resolution)

2.5%+5V accuracy under all allowed loading conditions

Lowest IR

<1000V : 150kΩ 1000-2000V : 400kΩ 2000-3000V : 2MΩ >3000V : 10MΩ

Highest IR

DUT resistive, isolated : 90MΩ per V

DUT capacitive, isolated : 2MΩ per V

DUT grounded : 0.1MΩ per V

Max Capacitance

<1000V : 2uF 1000-2000V : 0.25uF 2000-3000V : 0.1uF >3000V : 0.03uF

5mA maximum charging current

IR Accuracy

<5% of Highest IR: 2% (0.1% resolution) 5-15% of Highest IR: 5% (1% resolution) 15-30% of Highest IR: 10% (1% resolution) >30% of Highest IR: 20% (1% resolution)

Test Time

0.1 to 9999sec (0.1sec resolution) or user terminated

Test Delay

0.0 to 9999sec (0.1sec resolution)

Discharge

Internal 50KΩ discharge load and 0.03µF capacitive energy

Shutdown

Excessive HV terminal current: within 1ms

User Stop: within 2ms

Interlock opened (if enabled) : within 2ms

Load Breakdown (sudden uncontrolled increase of load current): within 150µs

IR Limit (if enabled) : within 100ms

ARC Limit (if enabled): within 1ms

User Settings

Voltage Level

DUT Isolated/Grounded

DUT Resistive/Capacitive

Min. IR Limit

Max. IR Limit (can be disabled)

Ramp Period

Dwell Period

Delay Period

Dwell End On Pass/Fail/Time/Steady or Rising

Ramp Down Fast/As Ramp

Stop/Continue Sequence on Failure

CONT Test Steps

Method

2 terminal measurement (DC)

Test Current

<10.5mA

Test Voltage

<4.15V

Range

0Ω to 60KΩ

Accuracy

<0.75Ω : 1.5% + 0.015Ω (0.001Ω resolution)

<13Ω : 1.5%+0.02Ω (0.01Ω resolution) 13-1000Ω : 3%+1Ω (1Ω resolution) 1K-4KΩ : 4% (10Ω resolution) 4K-13KΩ : 5% (100Ω resolution) >13KΩ : 10% (1KΩ resolution)

Test Time

0.06 to 9999sec (0.02sec resolution) or user terminated

CONT Leakage

DCW or IR test steps: <0.1µA

ACW test steps: <2.5µA per KV setting (DUT isolated), <5µA (DUT grounded)

User Settings

Min. Limit (can be disabled)

Max. Limit (can be disabled)

Resistance Offset

Test Time

Stop/Continue Sequence on Failure

GB Test Steps

Method

4 terminal measurement (AC)

Current

1 to 30Arms (0.01A resolution) sinewave at 50 or 60Hz +/- 0.05%

3%+10mA accuracy

Compliance

>4.5Vrms at all currents

Open Circuit

<10Vpk

DUT Ground

DUT may be isolated from ground or be grounded. If grounded, it must be within 3Vpk of V7X ground.

Range

Max resistance determined by max compliance and test current

Accuracy

<2A : 3.5%+3mΩ (1mΩ resolution) 2-6.5A : 3%+2mΩ (1mΩ resolution) >6.5A : 2.5%+1mΩ (0.1mΩ resolution)

Test Time

≤20A : 0.1 to 9999sec (0.02sec resolution) or user terminated

>20-25A : 0.1 to 180sec (0.02sec resolution) or user terminated

>25A : 0.1 to 120sec (0.02sec resolution) or user terminated (50% max duty cycle)

GB Leakage

DCW or IR test steps : <1µA

ACW test steps: <5µA per KV setting (DUT isolated), <10µA (DUT grounded)

User Settings

Current Level

Frequency

Min. Limit (can be disabled)

Max. Limit

Resistance Offset

Test Time

Stop/Continue Sequence on Failure

PAUSE Test Steps

Pause Delay

0.1 to 9999sec (0.02sec resolution)

User Settings

Pause Delay

HOLD Test Steps

Timeout

0.1 to 9999sec (0.02sec resolution) or none

User Settings

Timeout (can be disabled)

Message (two lines)

SWITCH Test Steps

Execution Time

User Settings

Sub Type (Model V75)

Relay states for each relay in the specified Sub Type (Model V75)

Relay states for each relay in each switch unit (4 max switch units) (All other models)

Dimensional Specifications

137mmH x 248mmW x 284mmD (5.4″ x 9.75″ x 11.2″)

V70, 71, 73, 75, and 79: 6.8kg (15lb) net, 7.9kg (17.5lb) shipping

V74: 7.9kg (17.5lb) net, 9.1kg (20lb) shipping

Dimensions and weights shown are nominal

Environmental Specifications

Storage Environment: -20 to 75C (non-condensing)

Operating Environment: 0 to 40C, <85% RH (non-condensing), Pollution Degree 2

Operating Altitude: 0 to 10000ft ASL, reduced maximum voltage capability above 5000ft

Power Source Specifications

Internally set for 105-125Vrms or 210-250Vrms, 45-65Hz, 200VA maximum

• Product Manual
• Data Sheet