Analog Test Instruments

מאפיינים מרכזיים

Analog test building blocks for high performance ATE.

Teradyne offers two families of analog test instruments

VXI-based Core System Instruments (CSi)
ZT-Series™ PXI/LXI instruments.
Both families meet today’s demanding test requirements as well as bringing improved test capability to legacy ATE systems.

Older analog instruments found in production and depot test systems used in defense and aerospace applications often result in slow throughput, inadequate test coverage, and spotty fault diagnosis of Line Replaceable Units (LRU)—especially newer units with more stringent performance specs.

Teradyne offers two families of analog test instruments

VXI-based Core System Instruments (CSi)
ZT-Series PXI/LXI instruments.
Both families meet today’s demanding test requirements as well as bringing improved test capability to legacy ATE systems.

CSi family instruments include Digital Sampling Oscilloscope (DSO), DMM, and Multi-Function Analog (MFA) capabilities that are ideal for both new and existing ATE systems. Several CSi instruments feature multi-channel parallel synchronized capabilities that speed test throughput.

The compact PXI- or LXI-based ZT-Series DSO and Arbitrary Waveform Generator (AWFG) instruments are perfect for new ATE systems requiring a smaller footprint.

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